PRECISION MEASUREMENTS WITH THE TOTAL REFLECTION X-RAY FLUORESCENCE SYSTEM IN DAR ES SALAAM

Authors

  • Y.I.A. Koleleni
  • J.W.A. Kondoro

Abstract

Total Reflection X-Ray Fluorescence (TXRF) analysis has been
developed at the Dar es Salaam University, Tanzania. The precision and accuracy were checked using samples of certified and reference materials. We have used the method to analyze aerosol samples

Published

2023-02-23